TURKISH JOURNAL OF PHYSICS
Turk J Phys
E-ISSN: 1303-6122
ISSN: 1300-0101
Year: 1998 Volume: 22 Number: 3
  1. Deformation Methods for Investigation of the Deep Level Parameters in Semiconductors
    S. Z. ZAINABIDINOV, A. ABDURAIMOV, O. O. MAMATKARIMOV, I.G. TURSUNOV, R.Kh. KHAMIDOV
    Turk J Phys, 22, (1998), 193-198
    Abstract   Full Text: PDF

  2. Interrelation of Magnetic Properties with the Crystal Structures of MeFeSe (Me = Ti; V; Cr; Fe; Co; Ni) Compounds
    R. SADIKHOV, A. NAMAZOV, J. GUSEINOV
    Turk J Phys, 22, (1998), 199-202
    Abstract   Full Text: PDF

  3. Modelling of Radiation Regime Receiver Cavities of Solar Power Plants
    Eduard AVANESOV, Nina BEREZHNAYA
    Turk J Phys, 22, (1998), 203-210
    Abstract   Full Text: PDF

  4. Anomalous Electrical Characteristics of Ion Implanted P^+-n Juntions
    N. SIDDIQUI
    Turk J Phys, 22, (1998), 211-218
    Abstract   Full Text: PDF

  5. Elastic Scattering of 344.5 MeV ^{12}C Ions From ^{11}B Nucleus
    S.A.E. KHALLAF, M.A. ABDEL-RAHMAN, S.K. ABDEL-RAHMAN, S.W.Z. MAHMOUD
    Turk J Phys, 22, (1998), 219-226
    Abstract   Full Text: PDF

  6. Electro-optic Response of a Polymer Dispersed Liquid Crystal Film
    Rıdvan KARAPINAR
    Turk J Phys, 22, (1998), 227-236
    Abstract   Full Text: PDF

  7. The Influence of the Dispersion of Boron Silicate on the Migration of Non-Equilibrium Charge Carriers Generated by Eect of an Electric Discharge
    A.M. HASANOV
    Turk J Phys, 22, (1998), 237-246
    Abstract   Full Text: PDF

  8. Reorientation of Magnetization in Thin Films
    Bengü KAPLAN
    Turk J Phys, 22, (1998), 247-252
    Abstract   Full Text: PDF

  9. Space Charge Limited Current in Films Obtained in Glow Discharge Plasma
    M.M. AKHMEDOV, M.K. KERIMOV, B.A. SULEIMANOV, S.A. MANSIMOV
    Turk J Phys, 22, (1998), 253-262
    Abstract   Full Text: PDF

  10. The Effect of Halogen Impurities on Electrocunductivity of Chalcogenide Glass Semicunductor Se-As System
    A.I. ISAOGLI, S.M. IBRAHIMGIZI, A.R. KAMILOGLI
    Turk J Phys, 22, (1998), 263-266
    Abstract   Full Text: PDF