Determination of Optical Constant of Materials by two Different Methods: An Application to Single Crystals Si

Authors: HAZİRET DURMUŞ, HALUK ŞAFAK, HALDUN KARABIYIK

Abstract: The normal reflectance of single crystal Si was measured at 0.5 ­5.6 eV range by unpolarized light. Optical parameters of Si were determined from this reflectance data by using two different methods: oscillator fit procedure and Kramers-Kronig analysis. The refractive index, extinction coefficient and the real and imaginary parts of complex dielectric constant obtained by these two methods were compared. A good agreement was found between two methods. Furthermore, the optical parameters so obtained seem to be in a satisfactory agreement with the literature.

Keywords: Optical Constant, Si Single Crystals, Oscillator Fit Procedure, Kramers-Kronig Analysis.

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